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Is radiation damage the limiting factor in high-resolution single particle imaging with X-ray free-electron lasers?
The prospect of single particle imaging with atomic resolution is one of the scientific drivers for the development of X-ray free-electron lasers. The assumption since the beginning has been that damage to the sample caused by intense X-ray pulses is one of the limiting factors for achieving subnano...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Crystallographic Association
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6701976/ https://www.ncbi.nlm.nih.gov/pubmed/31463335 http://dx.doi.org/10.1063/1.5098309 |