TOF-SIMS Analysis Using Bi(3)(+) as Primary Ions on Au Nanoparticles Supported by SiO(2)/Si: Providing Insight into Metal–Support Interactions

[Image: see text] Au nanoparticles with a mean diameter of 20 nm with a coverage of ∼20% of the surface were distributed on a Si wafer surface and studied both before and after being annealed (at 100 and 300 °C). The two types of samples were analyzed using secondary ion mass spectroscopy (SIMS) wit...

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Detalles Bibliográficos
Autores principales: Kim, Il Hee, Cha, Byeong Jun, Choi, Chang Min, Jin, Jong Sung, Choi, Myoung Choul, Kim, Young Dok
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2019
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6705091/
https://www.ncbi.nlm.nih.gov/pubmed/31460437
http://dx.doi.org/10.1021/acsomega.9b00985

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6705091/
https://www.ncbi.nlm.nih.gov/pubmed/31460437
http://dx.doi.org/10.1021/acsomega.9b00985

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