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TOF-SIMS Analysis Using Bi(3)(+) as Primary Ions on Au Nanoparticles Supported by SiO(2)/Si: Providing Insight into Metal–Support Interactions
[Image: see text] Au nanoparticles with a mean diameter of 20 nm with a coverage of ∼20% of the surface were distributed on a Si wafer surface and studied both before and after being annealed (at 100 and 300 °C). The two types of samples were analyzed using secondary ion mass spectroscopy (SIMS) wit...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2019
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6705091/ https://www.ncbi.nlm.nih.gov/pubmed/31460437 http://dx.doi.org/10.1021/acsomega.9b00985 |