Few-cycle Regime Atomic Force Microscopy

Traditionally, dynamic atomic force microscopy (AFM) techniques are based on the analysis of the quasi-steady state response of the cantilever deflection in terms of Fourier analysis. Here we describe a technique that instead exploits the often disregarded transient response of the cantilever throug...

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Detalles Bibliográficos
Autores principales: López-Guerra, Enrique A., Somnath, Suhas, Solares, Santiago D., Jesse, Stephen, Ferrini, Gabriele
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6722071/
https://www.ncbi.nlm.nih.gov/pubmed/31481670
http://dx.doi.org/10.1038/s41598-019-49104-1

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6722071/
https://www.ncbi.nlm.nih.gov/pubmed/31481670
http://dx.doi.org/10.1038/s41598-019-49104-1

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