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Few-cycle Regime Atomic Force Microscopy

Traditionally, dynamic atomic force microscopy (AFM) techniques are based on the analysis of the quasi-steady state response of the cantilever deflection in terms of Fourier analysis. Here we describe a technique that instead exploits the often disregarded transient response of the cantilever throug...

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Autores principales: López-Guerra, Enrique A., Somnath, Suhas, Solares, Santiago D., Jesse, Stephen, Ferrini, Gabriele
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6722071/
https://www.ncbi.nlm.nih.gov/pubmed/31481670
http://dx.doi.org/10.1038/s41598-019-49104-1
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author López-Guerra, Enrique A.
Somnath, Suhas
Solares, Santiago D.
Jesse, Stephen
Ferrini, Gabriele
author_facet López-Guerra, Enrique A.
Somnath, Suhas
Solares, Santiago D.
Jesse, Stephen
Ferrini, Gabriele
author_sort López-Guerra, Enrique A.
collection PubMed
description Traditionally, dynamic atomic force microscopy (AFM) techniques are based on the analysis of the quasi-steady state response of the cantilever deflection in terms of Fourier analysis. Here we describe a technique that instead exploits the often disregarded transient response of the cantilever through a relatively modern mathematical tool, which has caused important developments in several scientific fields but that is still quite unknown in the AFM context: the wavelet analysis. This tool allows us to localize the time-varying spectral composition of the initial oscillations of the cantilever deflection when an impulsive excitation is given (as in the band excitation method), a mode that we call the few-cycle regime. We show that this regime encodes very meaningful information about the tip-sample interaction in a unique and extremely sensitive manner. We exploit this high sensitivity to gain detailed insight into multiple physical parameters that perturb the dynamics of the AFM probe, such as the tip radius, Hamaker constant, sample’s elastic modulus and height of an adsorbed water layer. We validate these findings with experimental evidence and computational simulations and show a feasible path towards the simultaneous retrieval of multiple physical parameters.
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spelling pubmed-67220712019-09-17 Few-cycle Regime Atomic Force Microscopy López-Guerra, Enrique A. Somnath, Suhas Solares, Santiago D. Jesse, Stephen Ferrini, Gabriele Sci Rep Article Traditionally, dynamic atomic force microscopy (AFM) techniques are based on the analysis of the quasi-steady state response of the cantilever deflection in terms of Fourier analysis. Here we describe a technique that instead exploits the often disregarded transient response of the cantilever through a relatively modern mathematical tool, which has caused important developments in several scientific fields but that is still quite unknown in the AFM context: the wavelet analysis. This tool allows us to localize the time-varying spectral composition of the initial oscillations of the cantilever deflection when an impulsive excitation is given (as in the band excitation method), a mode that we call the few-cycle regime. We show that this regime encodes very meaningful information about the tip-sample interaction in a unique and extremely sensitive manner. We exploit this high sensitivity to gain detailed insight into multiple physical parameters that perturb the dynamics of the AFM probe, such as the tip radius, Hamaker constant, sample’s elastic modulus and height of an adsorbed water layer. We validate these findings with experimental evidence and computational simulations and show a feasible path towards the simultaneous retrieval of multiple physical parameters. Nature Publishing Group UK 2019-09-03 /pmc/articles/PMC6722071/ /pubmed/31481670 http://dx.doi.org/10.1038/s41598-019-49104-1 Text en © The Author(s) 2019 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
López-Guerra, Enrique A.
Somnath, Suhas
Solares, Santiago D.
Jesse, Stephen
Ferrini, Gabriele
Few-cycle Regime Atomic Force Microscopy
title Few-cycle Regime Atomic Force Microscopy
title_full Few-cycle Regime Atomic Force Microscopy
title_fullStr Few-cycle Regime Atomic Force Microscopy
title_full_unstemmed Few-cycle Regime Atomic Force Microscopy
title_short Few-cycle Regime Atomic Force Microscopy
title_sort few-cycle regime atomic force microscopy
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6722071/
https://www.ncbi.nlm.nih.gov/pubmed/31481670
http://dx.doi.org/10.1038/s41598-019-49104-1
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