Using Atomic Force Microscopy to Measure Thickness of Passive Film on Stainless Steel Immersed in Aqueous Solution

Employing atomic force microscopy (AFM) to measure passive film thickness on stainless steel (SS) in aqueous solution is proposed. SUS304 austenite and SUS329J4L duplex SS samples partly covered by gold were set in a minicell. To remove the original film, the SS surface but gold was etched using dil...

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Detalles Bibliográficos
Autores principales: Wang, Rongguang, Li, Yunhui, Xiao, Tian, Cong, Li, Ling, Yunhan, Lu, Zhaoxia, Fukushima, Chiharu, Tsuchitori, Isao, Bazzaoui, Mohammed
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6739317/
https://www.ncbi.nlm.nih.gov/pubmed/31511631
http://dx.doi.org/10.1038/s41598-019-49747-0

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6739317/
https://www.ncbi.nlm.nih.gov/pubmed/31511631
http://dx.doi.org/10.1038/s41598-019-49747-0

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