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Using Atomic Force Microscopy to Measure Thickness of Passive Film on Stainless Steel Immersed in Aqueous Solution
Employing atomic force microscopy (AFM) to measure passive film thickness on stainless steel (SS) in aqueous solution is proposed. SUS304 austenite and SUS329J4L duplex SS samples partly covered by gold were set in a minicell. To remove the original film, the SS surface but gold was etched using dil...
| Autores principales: | , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6739317/ https://www.ncbi.nlm.nih.gov/pubmed/31511631 http://dx.doi.org/10.1038/s41598-019-49747-0 |