Ef-cd locus shortens rice maturity duration without yield penalty

The contradiction between “high yielding” and “early maturing” hampers further improvement of annual rice yield. Here we report the positional cloning of a major maturity duration regulatory gene, Early flowering-completely dominant (Ef-cd), and demonstrate that natural variation in Ef-cd could be u...

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Detalles Bibliográficos
Autores principales: Fang, Jun, Zhang, Fantao, Wang, Hongru, Wang, Wei, Zhao, Fei, Li, Zijuan, Sun, Changhui, Chen, Faming, Xu, Fan, Chang, Shuoqi, Wu, Liang, Bu, Qingyun, Wang, Pingrong, Xie, Jiankun, Chen, Fan, Huang, Xuehui, Zhang, Yijing, Zhu, Xinguang, Han, Bin, Deng, Xiaojian, Chu, Chengcai
Formato: Online Artículo Texto
Lenguaje:English
Publicado: National Academy of Sciences 2019
Materias:
Biological Sciences
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6744900/
https://www.ncbi.nlm.nih.gov/pubmed/31451662
http://dx.doi.org/10.1073/pnas.1815030116

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6744900/
https://www.ncbi.nlm.nih.gov/pubmed/31451662
http://dx.doi.org/10.1073/pnas.1815030116

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