A Pixelated Microwave Near-Field Sensor for Precise Characterization of Dielectric Materials

A highly sensitive microwave near-field sensor based on electrically-small planar resonators is proposed for highly accurate characterization of dielectric materials. The proposed sensor was developed in a robust complete-cycle topology optimization procedure wherein first the sensing area was pixel...

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Detalles Bibliográficos
Autores principales: Saadat-Safa, Maryam, Nayyeri, Vahid, Ghadimi, Ali, Soleimani, Mohammad, Ramahi, Omar M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6746951/
https://www.ncbi.nlm.nih.gov/pubmed/31527610
http://dx.doi.org/10.1038/s41598-019-49767-w

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6746951/
https://www.ncbi.nlm.nih.gov/pubmed/31527610
http://dx.doi.org/10.1038/s41598-019-49767-w

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