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A Pixelated Microwave Near-Field Sensor for Precise Characterization of Dielectric Materials
A highly sensitive microwave near-field sensor based on electrically-small planar resonators is proposed for highly accurate characterization of dielectric materials. The proposed sensor was developed in a robust complete-cycle topology optimization procedure wherein first the sensing area was pixel...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6746951/ https://www.ncbi.nlm.nih.gov/pubmed/31527610 http://dx.doi.org/10.1038/s41598-019-49767-w |