Probing Surface Morphology using X-ray Grating Interferometry

X-ray reflectometry (XRR), a surface-sensitive technique widely used for characterizing surfaces, buried interfaces, thin films, and multilayers, enables determination of the electron density distribution perpendicular to a well-defined surface specularly reflecting X-rays. However, the electron den...

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Detalles Bibliográficos
Autores principales: Yashiro, Wataru, Ikeda, Susumu, Wada, Yasuo, Totsu, Kentaro, Suzuki, Yoshio, Takeuchi, Akihisa
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6773752/
https://www.ncbi.nlm.nih.gov/pubmed/31575992
http://dx.doi.org/10.1038/s41598-019-50486-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6773752/
https://www.ncbi.nlm.nih.gov/pubmed/31575992
http://dx.doi.org/10.1038/s41598-019-50486-5

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