Contactless transient carrier spectroscopy and imaging technique using lock-in free carrier emission and absorption

In this paper we present a contactless transient carrier spectroscopy and imaging technique for traps in silicon. At each pixel, we fit the transient decay of the trap emission which allows us to obtain both the trap time constant and trap concentration. Here we show that this technique allows for h...

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Detalles Bibliográficos
Autores principales: Rougieux, Fiacre E., Kwapil, Wolfram, Heinz, Friedemann, Siriwardhana, Manjula, Schubert, Martin C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6776499/
https://www.ncbi.nlm.nih.gov/pubmed/31582760
http://dx.doi.org/10.1038/s41598-019-49804-8

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6776499/
https://www.ncbi.nlm.nih.gov/pubmed/31582760
http://dx.doi.org/10.1038/s41598-019-49804-8

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