A Two Dimensional Tunneling Resistance Transmission Line Model for Nanoscale Parallel Electrical Contacts

Contact resistance and current crowding are important to nanoscale electrical contacts. In this paper, we present a self-consistent model to characterize partially overlapped parallel contacts with varying specific contact resistivity along the contact length. For parallel tunneling contacts formed...

Descripción completa

Detalles Bibliográficos
Autores principales: Banerjee, Sneha, Luginsland, John, Zhang, Peng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6785565/
https://www.ncbi.nlm.nih.gov/pubmed/31597925
http://dx.doi.org/10.1038/s41598-019-50934-2

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6785565/
https://www.ncbi.nlm.nih.gov/pubmed/31597925
http://dx.doi.org/10.1038/s41598-019-50934-2

Ejemplares similares