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A Two Dimensional Tunneling Resistance Transmission Line Model for Nanoscale Parallel Electrical Contacts
Contact resistance and current crowding are important to nanoscale electrical contacts. In this paper, we present a self-consistent model to characterize partially overlapped parallel contacts with varying specific contact resistivity along the contact length. For parallel tunneling contacts formed...
Autores principales: | Banerjee, Sneha, Luginsland, John, Zhang, Peng |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6785565/ https://www.ncbi.nlm.nih.gov/pubmed/31597925 http://dx.doi.org/10.1038/s41598-019-50934-2 |
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