Development of multiplex PCR to detect slow rust resistance genes Lr34 and Lr46 in wheat

Leaf rust caused by Puccinia triticina belongs to one of the most dangerous fungal diseases of wheat (Triticum aestivum L.) and is the cause of large yield losses every year. Here we report a multiplex polymerase chain reaction (PCR) assay, which was developed for detection of two important wheat sl...

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Detalles Bibliográficos
Autores principales: Skowrońska, Roksana, Kwiatek, Michał, Tomkowiak, Agnieszka, Nawracała, Jerzy
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer Berlin Heidelberg 2019
Materias:
Plant Genetics • Short Communication
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6803564/
https://www.ncbi.nlm.nih.gov/pubmed/31506776
http://dx.doi.org/10.1007/s13353-019-00520-z

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6803564/
https://www.ncbi.nlm.nih.gov/pubmed/31506776
http://dx.doi.org/10.1007/s13353-019-00520-z

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