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Development of multiplex PCR to detect slow rust resistance genes Lr34 and Lr46 in wheat
Leaf rust caused by Puccinia triticina belongs to one of the most dangerous fungal diseases of wheat (Triticum aestivum L.) and is the cause of large yield losses every year. Here we report a multiplex polymerase chain reaction (PCR) assay, which was developed for detection of two important wheat sl...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer Berlin Heidelberg
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6803564/ https://www.ncbi.nlm.nih.gov/pubmed/31506776 http://dx.doi.org/10.1007/s13353-019-00520-z |