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DeepRes: a new deep-learning- and aspect-based local resolution method for electron-microscopy maps
In this article, a method is presented to estimate a new local quality measure for 3D cryoEM maps that adopts the form of a ‘local resolution’ type of information. The algorithm (DeepRes) is based on deep-learning 3D feature detection. DeepRes is fully automatic and parameter-free, and avoids the is...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6830216/ https://www.ncbi.nlm.nih.gov/pubmed/31709061 http://dx.doi.org/10.1107/S2052252519011692 |