Data on lateral photocurrent along a Cu(In,Ga)Se(2) thin film as a function of air exposure time

Wavelength-dependent (i.e. penetration-depth-dependent) lateral photocurrent (i(LP)) measurement has been used to extract depth-resolved L(c) profiles, where L(c) is the minority carrier collection length by diffusion. The extracted L(c) depth-profiles can be used to determine the minority carrier d...

Descripción completa

Detalles Bibliográficos
Autores principales: Jang, Jiseong, Lee, Sangyeob, Chung, Choong-Heui
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2019
Materias:
Engineering
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6831709/
https://www.ncbi.nlm.nih.gov/pubmed/31700962
http://dx.doi.org/10.1016/j.dib.2019.104668

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6831709/
https://www.ncbi.nlm.nih.gov/pubmed/31700962
http://dx.doi.org/10.1016/j.dib.2019.104668

Ejemplares similares