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Data on lateral photocurrent along a Cu(In,Ga)Se(2) thin film as a function of air exposure time
Wavelength-dependent (i.e. penetration-depth-dependent) lateral photocurrent (i(LP)) measurement has been used to extract depth-resolved L(c) profiles, where L(c) is the minority carrier collection length by diffusion. The extracted L(c) depth-profiles can be used to determine the minority carrier d...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Elsevier
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6831709/ https://www.ncbi.nlm.nih.gov/pubmed/31700962 http://dx.doi.org/10.1016/j.dib.2019.104668 |