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Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy

With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample interaction potentials. Such quantitative experiments using noncontact frequency modulation atomic force microscopy is based o...

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Detalles Bibliográficos
Autores principales: Dagdeviren, Omur E., Miyahara, Yoichi, Mascaro, Aaron, Enright, Tyler, Grütter, Peter
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6832880/
https://www.ncbi.nlm.nih.gov/pubmed/31627343
http://dx.doi.org/10.3390/s19204510