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Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy
With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample interaction potentials. Such quantitative experiments using noncontact frequency modulation atomic force microscopy is based o...
Autores principales: | Dagdeviren, Omur E., Miyahara, Yoichi, Mascaro, Aaron, Enright, Tyler, Grütter, Peter |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6832880/ https://www.ncbi.nlm.nih.gov/pubmed/31627343 http://dx.doi.org/10.3390/s19204510 |
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