SAD phasing of XFEL data depends critically on the error model

A nonlinear least-squares method for refining a parametric expression describing the estimated errors of reflection intensities in serial crystallographic (SX) data is presented. This approach, which is similar to that used in the rotation method of crystallographic data collection at synchrotrons,...

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Detalles Bibliográficos
Autores principales: Brewster, Aaron S., Bhowmick, Asmit, Bolotovsky, Robert, Mendez, Derek, Zwart, Petrus H., Sauter, Nicholas K.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6834081/
https://www.ncbi.nlm.nih.gov/pubmed/31692470
http://dx.doi.org/10.1107/S2059798319012877

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6834081/
https://www.ncbi.nlm.nih.gov/pubmed/31692470
http://dx.doi.org/10.1107/S2059798319012877

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