XPS and FTIR Studies of Polytetrafluoroethylene Thin Films Obtained by Physical Methods

Two methods—attenuated total reflection Fourier infrared spectroscopy (ATR-FTIR) and X-ray photoelectron spectroscopy (XPS)—have been used to analyze the chemical structure of polytetrafluorethylene (PTFE) thin coatings deposited by pulsed laser (PLD) and pulsed electron beam (PED) ablations. The vo...

Descripción completa

Detalles Bibliográficos
Autores principales: Piwowarczyk, Joanna, Jędrzejewski, Roman, Moszyński, Dariusz, Kwiatkowski, Konrad, Niemczyk, Agata, Baranowska, Jolanta
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6835360/
https://www.ncbi.nlm.nih.gov/pubmed/31600899
http://dx.doi.org/10.3390/polym11101629

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6835360/
https://www.ncbi.nlm.nih.gov/pubmed/31600899
http://dx.doi.org/10.3390/polym11101629

Ejemplares similares