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XPS and FTIR Studies of Polytetrafluoroethylene Thin Films Obtained by Physical Methods

Two methods—attenuated total reflection Fourier infrared spectroscopy (ATR-FTIR) and X-ray photoelectron spectroscopy (XPS)—have been used to analyze the chemical structure of polytetrafluorethylene (PTFE) thin coatings deposited by pulsed laser (PLD) and pulsed electron beam (PED) ablations. The vo...

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Detalles Bibliográficos
Autores principales:	Piwowarczyk, Joanna, Jędrzejewski, Roman, Moszyński, Dariusz, Kwiatkowski, Konrad, Niemczyk, Agata, Baranowska, Jolanta
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2019
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6835360/ https://www.ncbi.nlm.nih.gov/pubmed/31600899 http://dx.doi.org/10.3390/polym11101629

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