Formation of Nanospikes on AISI 420 Martensitic Stainless Steel under Gallium Ion Bombardment

The focused ion beam (FIB) has proven to be an extremely powerful tool for the nanometer-scale machining and patterning of nanostructures. In this work, we experimentally study the behavior of AISI 420 martensitic stainless steel when bombarded by Ga(+) ions in a FIB system. The results show the for...

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Detalles Bibliográficos
Autores principales: Cenev, Zoran, Bartenwerfer, Malte, Klauser, Waldemar, Jokinen, Ville, Fatikow, Sergej, Zhou, Quan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Communication
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6836003/
https://www.ncbi.nlm.nih.gov/pubmed/31635089
http://dx.doi.org/10.3390/nano9101492

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6836003/
https://www.ncbi.nlm.nih.gov/pubmed/31635089
http://dx.doi.org/10.3390/nano9101492

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