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Formation of Nanospikes on AISI 420 Martensitic Stainless Steel under Gallium Ion Bombardment
The focused ion beam (FIB) has proven to be an extremely powerful tool for the nanometer-scale machining and patterning of nanostructures. In this work, we experimentally study the behavior of AISI 420 martensitic stainless steel when bombarded by Ga(+) ions in a FIB system. The results show the for...
Autores principales: | Cenev, Zoran, Bartenwerfer, Malte, Klauser, Waldemar, Jokinen, Ville, Fatikow, Sergej, Zhou, Quan |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6836003/ https://www.ncbi.nlm.nih.gov/pubmed/31635089 http://dx.doi.org/10.3390/nano9101492 |
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