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A new method to reliably determine elastic strain of various crystal structures from atomic-resolution images
Elastic strain engineering is an important strategy to design material properties in semiconductor and emerging advanced manufacturing industries. Recently, peak-pair method has drawn great attention compared to geometric phase analysis, owing to its precise determination of atom position at real sp...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6856106/ https://www.ncbi.nlm.nih.gov/pubmed/31727929 http://dx.doi.org/10.1038/s41598-019-52634-3 |