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X-ray diffraction data and analysis to support phase identification in FeSe and Fe(7)Se(8) epitaxial thin films
X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thin films grown by pulsed laser deposition (PLD) are presented to support the conclusions in the related research article “Double epitaxy of tetragonal and hexagonal phases in the FeSe system” [1]. The films contain β-FeSe and Fe...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Elsevier
2019
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6864172/ https://www.ncbi.nlm.nih.gov/pubmed/31763420 http://dx.doi.org/10.1016/j.dib.2019.104778 |