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Some reflections on symmetry: pitfalls of automation and some illustrative examples

In the context of increasing hardware and software automation in the process of crystal structure determination by X-ray diffraction, and based on conference sessions presenting some of the experience of senior crystallographers for the benefit of younger colleagues, an outline is given here of some...

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Detalles Bibliográficos
Autor principal: Clegg, William
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6895943/
https://www.ncbi.nlm.nih.gov/pubmed/31871736
http://dx.doi.org/10.1107/S2056989019014907