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Some reflections on symmetry: pitfalls of automation and some illustrative examples
In the context of increasing hardware and software automation in the process of crystal structure determination by X-ray diffraction, and based on conference sessions presenting some of the experience of senior crystallographers for the benefit of younger colleagues, an outline is given here of some...
Autor principal: | Clegg, William |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6895943/ https://www.ncbi.nlm.nih.gov/pubmed/31871736 http://dx.doi.org/10.1107/S2056989019014907 |
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