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Novel Z(eff) imaging method for deep internal areas using back-scattered X-rays
Elemental kinds, composition ratios, effective atomic number (Z(eff)), and spatial distributions are the most basic information on materials and determine the physical and chemical properties of materials. X-ray fluorescence analysis have conventionally been used for elemental mapping, however maps...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group UK
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6906522/ https://www.ncbi.nlm.nih.gov/pubmed/31827112 http://dx.doi.org/10.1038/s41598-019-54907-3 |