Amorphous Ge-Bi-Se Thin Films: A Mass Spectrometric Study

The Ge-Bi-Se thin films of varied compositions (Ge content 0–32.1 at. %, Bi content 0–45.7 at. %, Se content 54.3–67.9 at. %) have been prepared by rf magnetron (co)-sputtering technique. The present study was undertaken in order to investigate the clusters generated during the interaction of laser...

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Detalles Bibliográficos
Autores principales: Mawale, Ravi, Mandal, Govinda, Bouška, Marek, Gutwirth, Jan, Bora, Pankaj Lochan, Nazabal, Virginie, Havel, Josef, Němec, Petr
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6915747/
https://www.ncbi.nlm.nih.gov/pubmed/31844112
http://dx.doi.org/10.1038/s41598-019-55773-9

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6915747/
https://www.ncbi.nlm.nih.gov/pubmed/31844112
http://dx.doi.org/10.1038/s41598-019-55773-9

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