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Design of Microdisk-Shaped Ge on Si Photodetector with Recess Structure for Refractive-Index Sensing
In this paper, we introduce a disk-shaped Ge-on-Si photodetector for refractive-index difference sensing at an operating wavelength of 1550 nm. For the implementation of a small-scale sensor, a Ge layer was formed on top of a Si layer to increase the absorption coefficient at the expense of the ligh...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6928959/ https://www.ncbi.nlm.nih.gov/pubmed/31795361 http://dx.doi.org/10.3390/s19235253 |