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Design of Microdisk-Shaped Ge on Si Photodetector with Recess Structure for Refractive-Index Sensing

In this paper, we introduce a disk-shaped Ge-on-Si photodetector for refractive-index difference sensing at an operating wavelength of 1550 nm. For the implementation of a small-scale sensor, a Ge layer was formed on top of a Si layer to increase the absorption coefficient at the expense of the ligh...

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Detalles Bibliográficos
Autores principales: Seo, Dongjun, Park, Chang-Soo, Song, Young Min
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6928959/
https://www.ncbi.nlm.nih.gov/pubmed/31795361
http://dx.doi.org/10.3390/s19235253