Local V(OC) Measurements by Kelvin Probe Force Microscopy Applied on P-I-N Radial Junction Si Nanowires

This work focuses on the extraction of the open circuit voltage (V(OC)) on photovoltaic nanowires by surface photovoltage (SPV) based on Kelvin probe force microscopy (KPFM) measurements. In a first approach, P-I-N radial junction (RJ) silicon nanowire (SiNW) devices were investigated under illumina...

Descripción completa

Detalles Bibliográficos
Autores principales: Marchat, Clément, Dai, Letian, Alvarez, José, Le Gall, Sylvain, Kleider, Jean-Paul, Misra, Soumyadeep, Roca i Cabarrocas, Pere
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2019
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6937368/
https://www.ncbi.nlm.nih.gov/pubmed/31889245
http://dx.doi.org/10.1186/s11671-019-3230-5

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6937368/
https://www.ncbi.nlm.nih.gov/pubmed/31889245
http://dx.doi.org/10.1186/s11671-019-3230-5

Ejemplares similares