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Local V(OC) Measurements by Kelvin Probe Force Microscopy Applied on P-I-N Radial Junction Si Nanowires
This work focuses on the extraction of the open circuit voltage (V(OC)) on photovoltaic nanowires by surface photovoltage (SPV) based on Kelvin probe force microscopy (KPFM) measurements. In a first approach, P-I-N radial junction (RJ) silicon nanowire (SiNW) devices were investigated under illumina...
| Autores principales: | , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer US
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6937368/ https://www.ncbi.nlm.nih.gov/pubmed/31889245 http://dx.doi.org/10.1186/s11671-019-3230-5 |