Structure and Optical Properties of Co-Sputtered Amorphous Silicon Tin Alloy Films for NIR-II Region Sensor

Near-infrared brain imaging technology has great potential as a non-invasive, real-time inspection technique. Silicon-tin (SiSn) alloy films could be a promising material for near-infrared brain detectors. This study mainly reports on the structure of amorphous silicon tin alloy thin films by Raman...

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Detalles Bibliográficos
Autores principales: Jiang, Xiang-Dong, Li, Ming-Cheng, Guo, Rui-Kang, Wang, Ji-Min
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6947631/
https://www.ncbi.nlm.nih.gov/pubmed/31817654
http://dx.doi.org/10.3390/ma12244076

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6947631/
https://www.ncbi.nlm.nih.gov/pubmed/31817654
http://dx.doi.org/10.3390/ma12244076

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