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Structure and Optical Properties of Co-Sputtered Amorphous Silicon Tin Alloy Films for NIR-II Region Sensor
Near-infrared brain imaging technology has great potential as a non-invasive, real-time inspection technique. Silicon-tin (SiSn) alloy films could be a promising material for near-infrared brain detectors. This study mainly reports on the structure of amorphous silicon tin alloy thin films by Raman...
Autores principales: | Jiang, Xiang-Dong, Li, Ming-Cheng, Guo, Rui-Kang, Wang, Ji-Min |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2019
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6947631/ https://www.ncbi.nlm.nih.gov/pubmed/31817654 http://dx.doi.org/10.3390/ma12244076 |
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