Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor

A feasibility analysis is performed for the development and integration of a near-field scanning optical microscope (NSOM) tip–photodetector operating in the visible wavelength domain of an atomic force microscope (AFM) cantilever, involving simulation, processing, and measurement. The new tip–photo...

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Detalles Bibliográficos
Autores principales: Karelits, Matityahu, Lozitsky, Emanuel, Chelly, Avraham, Zalevsky, Zeev, Karsenty, Avi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6956262/
https://www.ncbi.nlm.nih.gov/pubmed/31888260
http://dx.doi.org/10.3390/nano9121792

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6956262/
https://www.ncbi.nlm.nih.gov/pubmed/31888260
http://dx.doi.org/10.3390/nano9121792

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