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Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor

A feasibility analysis is performed for the development and integration of a near-field scanning optical microscope (NSOM) tip–photodetector operating in the visible wavelength domain of an atomic force microscope (AFM) cantilever, involving simulation, processing, and measurement. The new tip–photo...

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Detalles Bibliográficos
Autores principales: Karelits, Matityahu, Lozitsky, Emanuel, Chelly, Avraham, Zalevsky, Zeev, Karsenty, Avi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6956262/
https://www.ncbi.nlm.nih.gov/pubmed/31888260
http://dx.doi.org/10.3390/nano9121792
_version_ 1783487118439350272
author Karelits, Matityahu
Lozitsky, Emanuel
Chelly, Avraham
Zalevsky, Zeev
Karsenty, Avi
author_facet Karelits, Matityahu
Lozitsky, Emanuel
Chelly, Avraham
Zalevsky, Zeev
Karsenty, Avi
author_sort Karelits, Matityahu
collection PubMed
description A feasibility analysis is performed for the development and integration of a near-field scanning optical microscope (NSOM) tip–photodetector operating in the visible wavelength domain of an atomic force microscope (AFM) cantilever, involving simulation, processing, and measurement. The new tip–photodetector consists of a platinum–silicon truncated conical photodetector sharing a subwavelength aperture, and processing uses advanced nanotechnology tools on a commercial silicon cantilever. Such a combined device enables a dual-mode usage of both AFM and NSOM measurements when collecting the reflected light directly from the scanned surface, while having a more efficient light collection process. In addition to its quite simple fabrication process, it is demonstrated that the AFM tip on which the photodetector is processed remains operational (i.e., the AFM imaging capability is not altered by the process). The AFM–NSOM capability of the processed tip is presented, and preliminary results show that AFM capability is not significantly affected and there is an improvement in surface characterization in the scanning proof of concept.
format Online
Article
Text
id pubmed-6956262
institution National Center for Biotechnology Information
language English
publishDate 2019
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-69562622020-01-23 Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor Karelits, Matityahu Lozitsky, Emanuel Chelly, Avraham Zalevsky, Zeev Karsenty, Avi Nanomaterials (Basel) Article A feasibility analysis is performed for the development and integration of a near-field scanning optical microscope (NSOM) tip–photodetector operating in the visible wavelength domain of an atomic force microscope (AFM) cantilever, involving simulation, processing, and measurement. The new tip–photodetector consists of a platinum–silicon truncated conical photodetector sharing a subwavelength aperture, and processing uses advanced nanotechnology tools on a commercial silicon cantilever. Such a combined device enables a dual-mode usage of both AFM and NSOM measurements when collecting the reflected light directly from the scanned surface, while having a more efficient light collection process. In addition to its quite simple fabrication process, it is demonstrated that the AFM tip on which the photodetector is processed remains operational (i.e., the AFM imaging capability is not altered by the process). The AFM–NSOM capability of the processed tip is presented, and preliminary results show that AFM capability is not significantly affected and there is an improvement in surface characterization in the scanning proof of concept. MDPI 2019-12-16 /pmc/articles/PMC6956262/ /pubmed/31888260 http://dx.doi.org/10.3390/nano9121792 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Karelits, Matityahu
Lozitsky, Emanuel
Chelly, Avraham
Zalevsky, Zeev
Karsenty, Avi
Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor
title Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor
title_full Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor
title_fullStr Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor
title_full_unstemmed Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor
title_short Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor
title_sort advanced surface probing using a dual-mode nsom–afm silicon-based photosensor
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6956262/
https://www.ncbi.nlm.nih.gov/pubmed/31888260
http://dx.doi.org/10.3390/nano9121792
work_keys_str_mv AT karelitsmatityahu advancedsurfaceprobingusingadualmodensomafmsiliconbasedphotosensor
AT lozitskyemanuel advancedsurfaceprobingusingadualmodensomafmsiliconbasedphotosensor
AT chellyavraham advancedsurfaceprobingusingadualmodensomafmsiliconbasedphotosensor
AT zalevskyzeev advancedsurfaceprobingusingadualmodensomafmsiliconbasedphotosensor
AT karsentyavi advancedsurfaceprobingusingadualmodensomafmsiliconbasedphotosensor