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Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor
A feasibility analysis is performed for the development and integration of a near-field scanning optical microscope (NSOM) tip–photodetector operating in the visible wavelength domain of an atomic force microscope (AFM) cantilever, involving simulation, processing, and measurement. The new tip–photo...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2019
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6956262/ https://www.ncbi.nlm.nih.gov/pubmed/31888260 http://dx.doi.org/10.3390/nano9121792 |