Accelerated Reliability Growth Test for Magnetic Resonance Imaging System Using Time-of-Flight Three-Dimensional Pulse Sequence

A magnetic resonance imaging (MRI) system is a complex, high cost, and long-life product. It is a widely known fact that performing a system reliability test of a MRI system during the development phase is a challenging task. The major challenges include sample size, high test cost, and long test du...

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Detalles Bibliográficos
Autores principales: Anand, Pradeep Kumar, Shin, Dong Ryeol, Saxena, Navrati, Memon, Mudasar Latif
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6963920/
https://www.ncbi.nlm.nih.gov/pubmed/31717721
http://dx.doi.org/10.3390/diagnostics9040164

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6963920/
https://www.ncbi.nlm.nih.gov/pubmed/31717721
http://dx.doi.org/10.3390/diagnostics9040164

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