Cryo-focused ion beam preparation of perovskite based solar cells for atom probe tomography

Focused-ion beam lift-out and annular milling is the most common method used for obtaining site specific specimens for atom probe tomography (APT) experiments and transmission electron microscopy. However, one of the main limitations of this technique comes from the structural damage as well as chem...

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Detalles Bibliográficos
Autores principales: Rivas, Nicolás Alfonso, Babayigit, Aslihan, Conings, Bert, Schwarz, Torsten, Sturm, Andreas, Garzón Manjón, Alba, Cojocaru-Mirédin, Oana, Gault, Baptiste, Renner, Frank Uwe
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2020
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6964857/
https://www.ncbi.nlm.nih.gov/pubmed/31945119
http://dx.doi.org/10.1371/journal.pone.0227920

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6964857/
https://www.ncbi.nlm.nih.gov/pubmed/31945119
http://dx.doi.org/10.1371/journal.pone.0227920

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