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Cryo-focused ion beam preparation of perovskite based solar cells for atom probe tomography
Focused-ion beam lift-out and annular milling is the most common method used for obtaining site specific specimens for atom probe tomography (APT) experiments and transmission electron microscopy. However, one of the main limitations of this technique comes from the structural damage as well as chem...
| Autores principales: | , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Public Library of Science
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6964857/ https://www.ncbi.nlm.nih.gov/pubmed/31945119 http://dx.doi.org/10.1371/journal.pone.0227920 |