Property Variation in Wavelength-thick Epsilon-Near-Zero ITO Metafilm for Near IR Photonic Devices

Thin indium tin oxide (ITO) films have been used as a medium to investigate epsilon-near-zero (ENZ) behavior for unconventional tailoring and manipulation of the light-matter interaction. However, the ENZ wavelength regime has not been studied carefully for ITO films with thicknesses larger than the...

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Detalles Bibliográficos
Autores principales: Ni, Jimmy H., Sarney, Wendy L., Leff, Asher C., Cahill, James P., Zhou, Weimin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6971020/
https://www.ncbi.nlm.nih.gov/pubmed/31959843
http://dx.doi.org/10.1038/s41598-020-57556-z

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6971020/
https://www.ncbi.nlm.nih.gov/pubmed/31959843
http://dx.doi.org/10.1038/s41598-020-57556-z

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