Structure Quality of LuFeO(3) Epitaxial Layers Grown by Pulsed-Laser Deposition on Sapphire/Pt

Structural quality of LuFeO [Formula: see text] epitaxial layers grown by pulsed-laser deposition on sapphire substrates with and without platinum Pt interlayers has been investigated by in situ high-resolution X-ray diffraction (reciprocal-space mapping). The parameters of the structure such as siz...

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Detalles Bibliográficos
Autores principales: Bauer, Sondes, Rodrigues, Adriana, Horák, Lukáš, Jin, Xiaowei, Schneider, Reinhard, Baumbach, Tilo, Holý, Václav
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6982296/
https://www.ncbi.nlm.nih.gov/pubmed/31877688
http://dx.doi.org/10.3390/ma13010061

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6982296/
https://www.ncbi.nlm.nih.gov/pubmed/31877688
http://dx.doi.org/10.3390/ma13010061

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