Damage accumulation mechanism in PIN diode limiters induced via multiple microwave pulses

Positive-intrinsic-negative (PIN) diodes are widely used as limiters to protect sensitive components from damage in radio frequency (RF) receiver systems and communication front-ends. However, PIN diode limiters can be burnt out due to the microwave pulses coupling through the front-end of RF receiv...

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Detalles Bibliográficos
Autores principales: Zhao, Jingtao, Chen, Quanyou, Zhao, Gang, Chen, Chaoyang, Chen, Zhidong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6997402/
https://www.ncbi.nlm.nih.gov/pubmed/32015468
http://dx.doi.org/10.1038/s41598-020-58710-3

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6997402/
https://www.ncbi.nlm.nih.gov/pubmed/32015468
http://dx.doi.org/10.1038/s41598-020-58710-3

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