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Damage accumulation mechanism in PIN diode limiters induced via multiple microwave pulses
Positive-intrinsic-negative (PIN) diodes are widely used as limiters to protect sensitive components from damage in radio frequency (RF) receiver systems and communication front-ends. However, PIN diode limiters can be burnt out due to the microwave pulses coupling through the front-end of RF receiv...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6997402/ https://www.ncbi.nlm.nih.gov/pubmed/32015468 http://dx.doi.org/10.1038/s41598-020-58710-3 |