AMST: Alignment to Median Smoothed Template for Focused Ion Beam Scanning Electron Microscopy Image Stacks

Alignment of stacks of serial images generated by Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) is generally performed using translations only, either through slice-by-slice alignments with SIFT or alignment by template matching. However, limitations of these methods are two-fold: the intr...

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Detalles Bibliográficos
Autores principales: Hennies, Julian, Lleti, José Miguel Serra, Schieber, Nicole L., Templin, Rachel M., Steyer, Anna M., Schwab, Yannick
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7004979/
https://www.ncbi.nlm.nih.gov/pubmed/32029771
http://dx.doi.org/10.1038/s41598-020-58736-7

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7004979/
https://www.ncbi.nlm.nih.gov/pubmed/32029771
http://dx.doi.org/10.1038/s41598-020-58736-7

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