High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method

This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface. Using the frequency-modulation (FM) method in AFM and KPFM, atomic resolution topography and contact potential difference (CPD)...

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Detalles Bibliográficos
Autores principales: Park, Young Min, Park, Joon Sik, Chung, Choong-Heui, Lee, Sangyeob
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2020
Materias:
Materials Science
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7005429/
https://www.ncbi.nlm.nih.gov/pubmed/32055662
http://dx.doi.org/10.1016/j.dib.2020.105177

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7005429/
https://www.ncbi.nlm.nih.gov/pubmed/32055662
http://dx.doi.org/10.1016/j.dib.2020.105177

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